Surface Science
Paper
01 Aug 1976

Electron scattering in silicon inversion layers by oxide and surface roughness

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Abstract

No abstract available.

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Date

01 Aug 1976

Publication

Surface Science

Authors

  • A. Hartstein
  • T.H. Ning
  • A.B. Fowler
IBM-affiliated at time of publication

Topics

  • Physical Sciences
  • Materials Discovery

Resources

  • Publication

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