Microscopy and Microanalysis
Paper
15 Jul 2003

Experience with the IBM sub-angstrom STEM

Download paper

Abstract

No abstract available.

Related

Paper

Quantum size effects in the surface-plasmon excitation of small metallic particles by electron-energy-loss spectroscopy

F. Ouyang, P.E. Batson, et al.

Physical Review B

Paper

Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface

P.E. Batson, K.L. Kavanagh, et al.

Physical Review Letters

Conference paper

Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond

V. Narayanan, V.K. Paruchuri, et al.

VLSI Technology 2006

Paper

Electron energy loss spectroscopy of single silicon nanocrystals: The conduction band

P.E. Batson, J.R. Heath

Physical Review Letters

View all publications
  1. Home
  2. ↳ Publications

Date

15 Jul 2003

Publication

Microscopy and Microanalysis

Authors

  • P.E. Batson
IBM-affiliated at time of publication

Resources

  • Download
  • Publication

Share