Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Atomic resolution electronic structure in silicon-based semiconductors

P.E. Batson

Journal of Electron Microscopy

Paper

Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope

P.E. Batson

Review of Scientific Instruments

Paper

WIEN FILTER ENERGY LOSS SPECTROMETER FOR THE DEDICATED SCANNING TRANSMISSION ELECTRON MICROSCOPE.

P.E. Batson

Scanning Electron Microscopy

Paper

Atomic resolution analytical microscopy

P.E. Batson

IBM J. Res. Dev

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