Lawrence Suchow, Norman R. Stemple
JES
Band dispersions E(k) and critical points of V3Si have been determined by k-selective angle-resolved photoemission with synchrotron radiation. A V-3d band (Δ1,2) which is very close to EF at Γ (Γ12) has been observed which is very flat near Γ along the ΓX direction, in agreement with recent APW calculations. Critical points of valence bands as well as their orbital character and density of states features have been determined. © 1981.
Lawrence Suchow, Norman R. Stemple
JES
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
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Advanced Materials