Conference paperVirtual metrology and run-to-run control in semiconductor manufacturingYada Zhu, Robert J. Baseman, et al.ISSAT-RQD 2012
PaperApplication of three-parameter lognormal distribution in EM data analysisBaozhen Li, Emmanuel Yashchin, et al.Microelectronics Reliability
Conference paperStatistically regulating program behavior via mainstream computingMark William Stephenson, Ram Rangan, et al.CGO 2010
PaperLikelihood ratio methods for monitoring parameters of a nested random effect modelEmmanuel YashchinJASA
