PaperParametric Modeling for Survival with Competing Risks and Masked Failure CausesBetty J. Flehinger, Benjamin Reiser, et al.Lifetime Data Analysis
PaperCost (or price) forecasting in the face of technological advanceDavid A. Harville, Emmanuel YashchinJASA
Conference paperMinimum void size and 3-parameter lognormal distribution for em failures in Cu interconnectsBaozhen Li, Cathryn Christiansen, et al.IRPS 2006
