P.C. Pattnaik, D.M. Newns
Physical Review B
An open-tube process has been used for Zn diffusion in GaAs1-xPx coated with SiO2 films to form p-n junctions. Electroluminescent diodes made by this method have a brightness of 600 ft-L at 5 A/cm2 with no etching of the surface required. The effects of temperature, time, and SiO2 thickness on junction depth, efficiency, and brightness of the diodes are described. © 1972, The Electrochemical Society, Inc. All rights reserved.
P.C. Pattnaik, D.M. Newns
Physical Review B
Hiroshi Ito, Reinhold Schwalm
JES
R. Ghez, M.B. Small
JES
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials