Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
An open-tube process has been used for Zn diffusion in GaAs1-xPx coated with SiO2 films to form p-n junctions. Electroluminescent diodes made by this method have a brightness of 600 ft-L at 5 A/cm2 with no etching of the surface required. The effects of temperature, time, and SiO2 thickness on junction depth, efficiency, and brightness of the diodes are described. © 1972, The Electrochemical Society, Inc. All rights reserved.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
T.N. Morgan
Semiconductor Science and Technology