PaperElectron states in narrow gate-induced channels in SiSteven E. Laux, Frank SternApplied Physics Letters
PaperChannel sensitivity to gate roughness in a split-gate GaAs-AlGaAs heterostructureArvind Kumar, Steven E. Laux, et al.Applied Physics Letters
PaperScreening and level broadening in inversion layers with random fixed chargesFrank SternSurface Science
