Tymon Barwicz, Ted W. Lichoulas, et al.
Optical Fiber Technology
We demonstrate the usefulness and high sensitivity of the atomic force microscope (AFM) for imaging surface dielectric properties and for potentiometry through the detection of electrostatic forces. Electric forces as small as 10-10 N have been measured, corresponding to a capacitance of 10 -19 farad. The sensitivity of our AFM should ultimately allow us to detect capacitances as low as 8×10-22 F. The method enables us to detect the presence of dielectric material over Si, and to measure the voltage in a p-n junction with submicron spatial resolution.
Tymon Barwicz, Ted W. Lichoulas, et al.
Optical Fiber Technology
H. Kumar Wickramasinghe
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Yves Martin, Swetha Kamlapurkar, et al.
ECTC 2019
Eric J. Zhang, Yves Martin, et al.
SPIE DCS 2019