R.V. Joshi, W. Hwang, et al.
International Symposium on VLSI Technology, Systems, and Applications, Proceedings
This paper presents a high-speed low-power cross-coupled active-pull-down ECL (CC-APD-ECL) circuit. The circuit features a cross-coupled active-pull-down scheme to improve the power-delay of the emitter-follower stage. The cross-coupled biasing scheme preserves the emitter-dotting capability and requires no extra biasing circuit branch and power for the active-pull-down transistor. Based on a 0.8 µm double-poly self-aligned bipolar technology at a power consumption of 1.0 mW/gate, the circuit offers 1.7× improvement in the loaded (FI/FO = 3, CL = 0.3 pF) delay, 2.1× improvement in the load driving capability, and 3.5× improvement in the dotting delay penalty compared with the conventional ECL circuit. The design considerations of the circuit are discussed. © 1995 IEEE
R.V. Joshi, W. Hwang, et al.
International Symposium on VLSI Technology, Systems, and Applications, Proceedings
R. Rodríguez, J.H. Stathis, et al.
Microelectronics Reliability
R.V. Joshi, W. Hwang, et al.
IEEE International SOI Conference 1999
C.J. Anderson, M.B. Ketchen
IEEE Transactions on Magnetics