Revanth Kodoru, Atanu Saha, et al.
arXiv
A high surface concentration layer is essential for obtaining good ohmic contact on GaAs devices. Zn diffusion in GaAs using Zn3As2, ZnAs2, Zn3As2 + ZnAs2, and ZnAs2 + As as diffusion sources at low temperatures (600°-730'C) has been studied. The resulting surfaces were reproducible and undamaged, and the surface concentrations were in the 1020 cm-3 range. © 1976, The Electrochemical Society, Inc. All rights reserved.
Revanth Kodoru, Atanu Saha, et al.
arXiv
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Ellen J. Yoffa, David Adler
Physical Review B
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting