F.J. Himpsel, T.A. Jung, et al.
IBM J. Res. Dev
An oscillatory reversal of the contrast between Cu and Mo is observed with scanning tunneling microscopy (STM), using sample bias voltages of +5 V and higher. It is attributed to tunneling via a series of discrete states that are induced by a combination of the image potential and the applied field. They are offset in energy due to the different work functions of Cu and Mo. This effect provides a generally applicable mechanism for elemental contrast in STM. © 1995 The American Physical Society.
F.J. Himpsel, T.A. Jung, et al.
IBM J. Res. Dev
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Physical Review B
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Physical Review B
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