William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems. © 2014 American Physical Society.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures