A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The interlayer penetration depth in layered superconductors may be determined from scanning Superconducting QUantum Interference Device (SQUID) microscope images of interlayer Josephson vortices. We compare our findings at 4 K for single crystals of the organic superconductor κ-(BEDT-TTF)2Cu(NCS)2 and three near-optimally doped cuprate superconductors: La2-xSrxCuO4, (Hg,Cu)Ba2CuO4+δ, and Tl2Ba2CuO6+δ. © 2000 Elsevier Science B.V. All rights reserved.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
David B. Mitzi
Journal of Materials Chemistry
I. Morgenstern, K.A. Müller, et al.
Physica B: Physics of Condensed Matter
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures