Conference paper
A novel high-performance lateral bipolar on SOI
G. Shahidi, D.D. Tang, et al.
IEDM 1991
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
G. Shahidi, D.D. Tang, et al.
IEDM 1991
D.L. Harame, J.M.C. Stork, et al.
IEDM 1993
J.B. Kuang, M.J. Saccamango, et al.
IEEE International SOI Conference 1999
A. Deutsch, W.D. Becker, et al.
IEEE Topical Meeting EPEPS 1996