Temperature stability of AuGeNi ohmic contacts to GaAs
A.C. Callegari, M. Murakami, et al.
ESSDERC 1987
We have developed a process for the fabrication of YBaCuO high-T c junctions based on the step-edge weak-link concept. The process emphasizes the creation of sharp and straight step edges on a substrate, and the restoration of oxygen content for superconducting materials at the step edges. A diamond-like carbon film is used as an ion milling mask for the creation of steps on substrates such as LaAlO3 and SrTiO3. Room-temperature plasma oxidation is shown to be effective in restoring T c from processing related degradation for grains residing at the step edge. Using this process, dc SQUIDs were fabricated with 77 K electrical performances matching, and in certain cases exceeding, similar SQUIDs made using bicrystal-based tilt-boundary weak-link junctions.
A.C. Callegari, M. Murakami, et al.
ESSDERC 1987
W.J. Gallagher
IEEE Circuits and Devices Magazine
R.H. Koch, W. Eidelloth, et al.
Applied Physics Letters
J.K. DeBrosse, C. Arndt, et al.
VLSI Circuits 2004