Antonio D. Córcoles, Abhinav Kandala, et al.
Proceedings of the IEEE
We demonstrate enhanced relaxation and dephasing times of transmon qubits, up to ∼ 60 μ s, by fabricating the interdigitated shunting capacitors using titanium nitride (TiN). Compared to qubits made with lift-off aluminum deposited simultaneously with the Josephson junction, this represents as much as a six-fold improvement and provides evidence that surface losses from two-level system (TLS) defects residing at or near interfaces contribute to decoherence. Concurrently, we observe an anomalous temperature dependent frequency shift of TiN resonators, which is inconsistent with the predicted TLS model. © 2013 AIP Publishing LLC.
Antonio D. Córcoles, Abhinav Kandala, et al.
Proceedings of the IEEE
Neereja Sundaresan, Theodore J. Yoder, et al.
Nature Communications
P. Sharma, Antonio D. Córcoles, et al.
Physical Review Letters
Diego Ristè, Marcus P. Da Silva, et al.
npj Quantum Information