P.E. Batson
IBM J. Res. Dev
We have introduced a modest power (50 mW) laser beam into a high resolution scanning transmission electron microscope in order to heat samples to high temperatures and cool them rapidly enough to]] freeze in" the effects of the high temperature. Sequential micrographs of the sample taken after 0.1-s heating pulses show, for example, material migration, grain growth, and crystallization of amorphous silicon evaporated on to 50-nm Si3N4 substrates.
P.E. Batson
IBM J. Res. Dev
P.L. Liu, R. Yen, et al.
Applied Physics Letters
G.A. Sai-Halasz, R.T. Hodgson
Physics Letters A
C.Y. Wong, C.R.M. Grovenor, et al.
Journal of Applied Physics