Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
We briefly review recent progress in elucidating the time-independent critical behavior of systems with infinite numbers of static absorbing states, and show that the critical exponent describing the decay with time of the order parameter right at the critical point is the same as that of the directed percolation problem.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Laxmi Parida, Pier F. Palamara, et al.
BMC Bioinformatics
Julian Schuhmacher, Marco Ballarin, et al.
PRX Quantum
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997