Ronald Troutman
Synthetic Metals
Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 1517 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1×1 net (a0=3.93), and that the bulk interlayer spacing is 1.620.04. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}. © 1991 The American Physical Society.
Ronald Troutman
Synthetic Metals
Ming L. Yu
Physical Review B
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983