D. Weller, A. Carl, et al.
Journal of Physics and Chemistry of Solids
The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren-Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-Å x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10-4 range) of stacking-fault probabilities.
D. Weller, A. Carl, et al.
Journal of Physics and Chemistry of Solids
T.C. Huang, W.-Y. Lee, et al.
Japanese Journal of Applied Physics
J.K. Howard, T.C. Huang
Journal of Applied Physics
D.T. Brower, R.E. Revay, et al.
Powder Diffraction