J. Andreas Larsson, Simon D. Elliott, et al.
Physical Review B - CMMP
We propose measuring the lifetime of localized states below the conduction band to determine the local thickness of thin insulating films using scanning tunneling microscopy. The lifetime, which is a characteristic fingerprint of the film thickness, is inversely proportional to the saturation value of the tunnel current through the localized state at close tip-sample separation and is readily measured using scanning tunneling spectroscopy. We demonstrate the method for 5-11 monolayer thick NaCl films grown on Cu(111). © 2014 AIP Publishing LLC.
J. Andreas Larsson, Simon D. Elliott, et al.
Physical Review B - CMMP
Leo Gross, Fabian Mohn, et al.
Nature Chemistry
Fabian Mohn, Bruno Schuler, et al.
Applied Physics Letters
Leo Gross, Fabian Mohn, et al.
Europhysics News