David W. Abraham, C.C. Williams, et al.
Journal of Microscopy
We describe a new method for imaging magnetic fields with 1000 Å resolution. The technique is based on using a force microscope to measure the magnetic force between a magnetized tip and the scanned surface. The method shows promise for the high-resolution mapping of both static and dynamic magnetic fields.
David W. Abraham, C.C. Williams, et al.
Journal of Microscopy
M.P. O'Boyle, T.T. Hwang, et al.
Applied Physics Letters
David W. Abraham, T.J. Chainer, et al.
INTERMAG 2003
P.C.D. Hobbs, Y. Martin, et al.
Proceedings of SPIE 1989