Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
PaperCharacterization of large magnetic anisotropies in (100)- and (111)-oriented Co/Pt multilayers by Brillouin light scatteringJ.V. Harzer, B. Hillebrands, et al.Journal of Magnetism and Magnetic Materials