PaperOrigin of the Peaked Structure in the Conductance of One-Dimensional Silicon Accumulation LayersR.A. Webb, A. Hartstein, et al.Physical Review Letters
PaperExperimental study of the current flow in the quantum Hall regimeCh. Simon, B.B. Goldberg, et al.Physical Review B
PaperElectron scattering in silicon inversion layers by oxide and surface roughnessA. Hartstein, T.H. Ning, et al.Surface Science
PaperQuantized magnetoresistance in two-dimensional electron systemsF. Fang, P.J. StilesPhysical Review B
