Hiroshi Ito, Reinhold Schwalm
JES
The magnetoconductance of ultranarrow Si accumulation layers has been measured using a pinched metal-oxide-semiconductor field-effect transistor. The data have two noteworthy features. First, the electron density inferred from Shubnikov-de Haas oscillations is much smaller than that expected for our device. Also, structure in the magnetoconductance persists down to low gate voltages where the temperature-dependent conductance appears to be in the limit of one-dimensional strong localization. © 1986 The American Physical Society.
Hiroshi Ito, Reinhold Schwalm
JES
Mark W. Dowley
Solid State Communications
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009