F. Holtzberg, T.R. McGuire, et al.
Journal of Applied Physics
The CrO2 thin films epitaxially on TiO2(100) and Al2O3(0001) substrates were successively grown. The films have been structurally characterized using ex situ RHEED, X-ray diffraction and ion channeling spectroscopy. A Curie temperature of around 393 K is observed for the films, with those grown on TiO2 exhibiting a large magneto-crystalline anisotropy. Transport measurements show that films on TiO2 have a resistivity drop of about two orders upon cooling down from room temperature to 5 K.