Magnetoresistive random access memory (MRAM) and reliability

Abstract

This paper provides an overview of the design and operation of, and materials used in, magnetoresistive random access memory (MRAM) with emphasis from a reliability engineering perspective. The speaker will provide background information on MRAM architectures and discuss novel reliability problems inherent to MRAM. Reliability issues and concerns will be discussed and illustrated with examples wherever possible. The intention of the paper is to give attendees a basic and broad introduction to the potential reliability issues and challenges raised by this new memory form.