Conference paper
Low-temperature operation of silicon bipolar ECL circuits
J.D. Cressler, D.D. Tang, et al.
ISSCC 1989
Paper
Measurement of PLL phase error caused by power supply noise
Abstract
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400MHz microprocessor.
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