D. Singh, Keith A. Jenkins, et al.
Electronics Letters
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400MHz microprocessor.
D. Singh, Keith A. Jenkins, et al.
Electronics Letters
Keith A. Jenkins, Y. Taur, et al.
IEEE International SOI Conference 1996
J. Warnock, J.D. Cressler, et al.
IEEE Electron Device Letters
J.N. Burghartz, M. Soyuer, et al.
ESSDERC 1995