Conference paper
A novel high-performance lateral bipolar on SOI
G. Shahidi, D.D. Tang, et al.
IEDM 1991
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400MHz microprocessor.
G. Shahidi, D.D. Tang, et al.
IEDM 1991
D.R. Greenberg, S. Sweeney, et al.
Technical Digest - International Electron Devices Meeting
J.N. Burghartz, M. Soyuer, et al.
ESSDERC 1995
B.H. Lee, A.C. Mocuta, et al.
IEDM 2002