Mark W. Dowley
Solid State Communications
Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.
Mark W. Dowley
Solid State Communications
A. Gangulee, F.M. D'Heurle
Thin Solid Films
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology