Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Proton-induced X-rays have been used for the measurement of mass absorption coefficients in the 0.1 to 1 keV energy range. In this technique the absorbing film is supported directly on a substrate which under proton bombardment will generate the characteristic substrate radiation whose absorption in the film will be measured. Results are given for twelve different metals at the B K alpha (184 eV) line.
T.N. Morgan
Semiconductor Science and Technology
Hiroshi Ito, Reinhold Schwalm
JES
J.H. Stathis, R. Bolam, et al.
INFOS 2005
Mitsuru Ueda, Hideharu Mori, et al.
Journal of Polymer Science Part A: Polymer Chemistry