Measurements of the effects of asymmetry in an on-chip regulated power distribution system using a dual trace josephson sampling oscilloscope

C.-K. Hu, N.J. Mazzeo, et al.

Thin Solid Films

G.-P. Li, M.B. Ketchen

Advances in Semiconductors and Semiconductor Structures 1987

C.T. Chuang, P.F. Lu, et al.

International Journal of Electronics

V. Foglietti, A. Pasquarelli, et al.

IEEE TAS