Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Although ultraviolet photoelectron emission spectroscopy and microscopy have served as powerful tools for electronic structure analysis in both reciprocal and real space, the integration of spectroscopy into microscopy still remains a challenge due to the technical difficulty of achieving both high spatial and energy resolution with slow electrons. We demonstrate photoelectron emission spectroscopy and microscopy covering the real, reciprocal, and energy spaces efficiently, enabled by a recently developed energy-filtered microscope. Observation of photoemission from micron-sized silver islands using HeI radiation reveals the importance of the unreduced final-state wave vectors, which determine the photoelectron angular distribution. © 2009 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Ronald Troutman
Synthetic Metals
K.A. Chao
Physical Review B
T.N. Morgan
Semiconductor Science and Technology