Conference paper
LASER ENHANCED PLATING AND ETCHING: A REVIEW.
R.J. Von Gutfeld
International Conference on Laser Processing and Diagnostics 1983
A novel vacuum sample holder is described for use with an optical microscope. The sample stage temperature can be made to vary from ∼ 30 to 800 K. Electrical feedthroughs together with an optical window provide convenient features for use in a wide variety of experiments. Data for optically induced transverse thermoelectric voltages of a Pd film as a function of temperature are presented.
R.J. Von Gutfeld
International Conference on Laser Processing and Diagnostics 1983
R.J. Von Gutfeld, B. Welber, et al.
IEEE JQE
R.J. Von Gutfeld, D.R. Vigliotti, et al.
CLEO 1984
R.J. Von Gutfeld, A.H. Nethercot Jr.
Physical Review Letters