G. Arjavalingam, Y. Pastol, et al.
Proceedings of SPIE 1989
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
G. Arjavalingam, Y. Pastol, et al.
Proceedings of SPIE 1989
Vincent A. Ranieri, Alina Deutsch, et al.
IEEE Trans. Instrum. Meas.
A. Deutsch, G. Arjavalingam, et al.
ECTC 1994
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