Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
Measurement of the broadband (15–150 GHz) microwave dielectric properties of free-standing films is demonstrated using the technique of coherent microwave transient spectroscopy. The accuracy of the method is verified by experiments on a fused silica sheet whose dielectric properties are well known. Results of measurements on (~200 µm thick) polymer films are presented. © 1992, The Institution of Electrical Engineers. All rights reserved.
Y. Pastol, G. Arjavalingam, et al.
Electronics Letters
Y. Pastol, G. Arjavalingam, et al.
APS 1990
G. Arjavalingam, Barry J. Rubin
Proceedings of SPIE 1989
M. Kesler, G. Arjavalingam
Proceedings of SPIE 1989