David B. Mitzi
Journal of Materials Chemistry
This paper describes a number of significant modeling considerations for SiGe heterojunction bipolar transistor power amplifiers operating at millimeter-wave frequencies. Small-and large-signal model-to-hardware correlation is presented for single transistor amplifiers, as well as for a combined dual-stage amplifier up to 65 GHz. The relevant parasitic effects are described along with the proposed modeling approach for each of them. The limits of the standard Vertical Bipolar Inter-Company device model at high-injection and their effect on the prediction of the achievable large-signal compression and power-added efficiency are also discussed. © 2006 IEEE.
David B. Mitzi
Journal of Materials Chemistry
T.N. Morgan
Semiconductor Science and Technology
Scott K. Reynolds, Brian A. Floyd, et al.
Proceedings of the IEEE
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983