John Clarke, Roger H. Koch
Science
We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by randomly oriented defects with a density of 5×1017m-2 yield 1/f noise magnitudes in good agreement with experiments. © 2007 The American Physical Society.
John Clarke, Roger H. Koch
Science
Richard F. Voss, John Clarke
Journal of the Acoustical Society of America
Krysta M. Svore, Barbara M. Terhal, et al.
Physical Review A - AMO
Richard F. Voss, Robert B. Laibowitz, et al.
Journal of Applied Physics