Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
No abstract available.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
J.K. Gimzewski, T.A. Jung, et al.
Surface Science