Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
A low-energy electron-diffraction intensity analysis of data from a clean Ag{001} surface finds no multilayer relaxation, i.e., with dik being the change in spacing between layer i and layer k, d12=0±0.03 and d23=0±0.03. These results are compared with the results of first-principles total-energy calculations and with other recent relaxation determinations on fcc {001} surfaces. © 1991 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials