Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
P. Alnot, D.J. Auerbach, et al.
Surface Science
Mark W. Dowley
Solid State Communications
T. Schneider, E. Stoll
Physical Review B