R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering