Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
H.D. Dulman, R.H. Pantell, et al.
Physical Review B