Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
A. Krol, C.J. Sher, et al.
Surface Science
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings