Daniel Jacobsson, Federico Panciera, et al.
Nature
We visualize atomic level dynamics during Si nanowire growth using aberration corrected environmental transmission electron microscopy, and compare with lower pressure results from ultra-high vacuum microscopy. We discuss the importance of higher pressure observations for understanding growth mechanisms and describe protocols to minimize effects of the higher pressure background gas.
Daniel Jacobsson, Federico Panciera, et al.
Nature
B. Wacaser, Maha M. Khayyat, et al.
PVSC 2010
Sardar B. Alam, Federico Panciera, et al.
Nano Letters
Maha Mohammed Khayyat, Brent A. Wacaser, et al.
Communications and Photonics Conference 2011