Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
It is shown that band structure effects give a small but not negligible contribution to the transverse cyclotron mass enhancement in silicon [100] field effect transistor devices. For carrier concentrations of about 8 × 1012 electrons per cm2 the mass increases by approximately Δm* = 0.005, i.e. 2.4%. In opposition to the many-body corrections, the band structure enhancement increases with concentration. © 1976.
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.W. Gammon, E. Courtens, et al.
Physical Review B
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Michiel Sprik
Journal of Physics Condensed Matter