Conference paper
Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
It is shown that band structure effects give a small but not negligible contribution to the transverse cyclotron mass enhancement in silicon [100] field effect transistor devices. For carrier concentrations of about 8 × 1012 electrons per cm2 the mass increases by approximately Δm* = 0.005, i.e. 2.4%. In opposition to the many-body corrections, the band structure enhancement increases with concentration. © 1976.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
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Surface Review and Letters
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Physics of Fluids
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