Conference paper
Invited: Integrated optical circuitry
E.G. Lean
ISSCC 1972
A new and sensitive measurement technique of determining elastic properties of a thin film on a substrate based on harmonic generation of dispersive Rayleigh waves is demonstrated. The technique has a sensitivity of detecting a change of 0.001% in velocity due to the loading of the thin film. A damaged layer of about 20 Å on a mechanically polished LiNbO3 substrate is detectable. © 1971 The American Institute of Physics.
E.G. Lean
ISSCC 1972
L. Kuhn, P.F. Heidrich, et al.
Applied Physics Letters
E.G. Lean, J.M. White, et al.
Acousto-Optics: Device Development/Instrumentation/Applications 1976
E.G. Lean, W.H. Chen
Applied Physics Letters