Samuele Ruffino, Kumudu Geethan Karunaratne, et al.
DATE 2024
We report the design, fabrication, and characterization of cantilevers with integrated AlN actuators and conductive PtSi tips for multi-frequency atomic force microscopy. These cantilevers also possess a stepped-rectangular geometry. The excellent dynamic behavior of these cantilevers is investigated using both finite-element simulations and experimental methods. Several imaging experiments are presented to illustrate the efficacy and versatility of these cantilevers. © 2012 American Institute of Physics.
Samuele Ruffino, Kumudu Geethan Karunaratne, et al.
DATE 2024
Dennis V Christensen, Regina Dittmann, et al.
Neuromorph. Comput. Eng.
Mario Lanza, Abu Sebastian, et al.
Science
Abu Sebastian, Angeliki Pantazi
IEEE TCST