Leo Gross, Fabian Mohn, et al.
Science
Paper
Novel optical approach to atomic force microscopy
Abstract
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Related
Nikolaj Moll, Leo Gross, et al.
New Journal of Physics
Bruno Schuler, Shadi Fatayer, et al.
Energy and Fuels
Niko Pavliček, Anish Mistry, et al.
Nature Nanotechnology