Peter Liljeroth, Ingmar Swart, et al.
Nano Letters
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Peter Liljeroth, Ingmar Swart, et al.
Nano Letters
Leo Gross, Nikolaj Moll, et al.
Physical Review Letters
Shadi Fatayer, Alysha I. Coppola, et al.
Geophysical Research Letters
Fabian Schulz, Mario Commodo, et al.
Proc. Combust. Inst.