G. Grinstein
Journal of Applied Physics
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
G. Grinstein
Journal of Applied Physics
D.J. Bergman, E. Ben-Jacob, et al.
Physical Review A
J. Tersoff, Yuhai Tu, et al.
Applied Physics Letters
T. Bohr, G. Grinstein, et al.
Chaos