Daniel Loss, David P. DiVincenzo, et al.
Physical Review Letters
A solid-on-solid interface representation of the random-field Ising model is studied numerically in two dimensions. The interface width varies linearly with sample size, in agreement with simple energy-accounting arguments and recent theories which predict that two is the lower critical dimension of the random-field Ising model. © 1983 The American Physical Society.
Daniel Loss, David P. DiVincenzo, et al.
Physical Review Letters
Matthew P. A. Fisher, G. Grinstein
Physical Review Letters
S. Ingvarsson, Gang Xiao, et al.
Physical Review Letters
J.F. Fernandez, E. Pytte
Physical Review B