G. Salis, A. Fuhrer, et al.
Physical Review B - CMMP
The scanning force microscope is used to deposite charge carriers on insulating Si3N4 films and to monitor their recombination. The charge decay shows up as a discontinuous staircase, demonstrating single-carrier resolution. The decay is found to be controlled by thermionic emission. © 1990 The American Physical Society.
G. Salis, A. Fuhrer, et al.
Physical Review B - CMMP
H.R. Borsje, H.W.H.M. Jongbloets, et al.
Review of Scientific Instruments
D.J. Webb, J. Fompeyrine, et al.
Microelectronic Engineering
D.L. Abraham, A. Veider, et al.
Applied Physics Letters