S.F. Alvarado
Materials Science and Engineering B
The scanning force microscope is used to deposite charge carriers on insulating Si3N4 films and to monitor their recombination. The charge decay shows up as a discontinuous staircase, demonstrating single-carrier resolution. The decay is found to be controlled by thermionic emission. © 1990 The American Physical Society.
S.F. Alvarado
Materials Science and Engineering B
B. Dauth, S.F. Alvarado, et al.
Physical Review Letters
S.F. Alvarado, P.S. Bagus
Physics Letters A
S.F. Alvarado, F. La Mattina, et al.
Applied Physics A: Materials Science and Processing