William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
The positions of x-ray diffraction peaks from a polycrystalline iron oxide thin film have been measured in a grazing-incidence, asymmetric Bragg geometry for incidence angles between 0.09°and 1.04°. The peak positions are shifted from the Bragg angles 2,B due to refraction of the incident x rays as they penetrate the air-solid interface. The shifts are quantitatively consistent with those obtained by applying Fresnel boundary conditions for reflection and refraction of a plane electromagnetic wave at an interface between air and a uniform, absorbing dielectric and they provide confidence in the validity of the Fresnel boundary conditions in the x-ray regime. © 1989 The American Physical Society.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Ronald Troutman
Synthetic Metals