J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
High resolution electron microscopy studies of the oxidation of vapor deposited Cu (<30 ) on thin single crystal Au films are reported. The metal/metal and oxide/metal orientation relationships are obtained for both the diffraction and imaging modes, before and after the Cu oxidation is significant. For the oxidized overlayers, two cases are observed: Cu(111) which transforms to three Cu2O(110) variants and Cu(110) transforming to (211) oxide overgrowth. A lateral displacement of the top Cu layer in the (110) stacking sequence is detected in the first case and atomic layering is observed in the 6-layer lattice structure of the Cu2O(211) orientation. © 1987 Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division).
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
P.C. Pattnaik, D.M. Newns
Physical Review B
Revanth Kodoru, Atanu Saha, et al.
arXiv
K.N. Tu
Materials Science and Engineering: A