F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
On-chip microstrip transmission lines have been measured on-wafer from below 1 GHz up to 110 GHz. Using different pad de-embedding techniques as well as a technique based on two transmission lines of different length, the characteristic transmission line parameters have been accurately determined. The results are compared against simulation results from an electromagnetic full-wave solution and the parametric IBM model which is available in the technology's design kit.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
P. Alnot, D.J. Auerbach, et al.
Surface Science
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
K.N. Tu
Materials Science and Engineering: A