John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
L Auslander, E Feig, et al.
Advances in Applied Mathematics
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Igor Devetak, Andreas Winter
ISIT 2003