PaperCrystallographic texture change during abnormal grain growth in Cu-Co thin filmsJ.M.E. Harper, J. Gupta, et al.Applied Physics Letters
PaperCalculated structures for [001] symmetrical tilt grain boundaries in siliconA.A. Levi, D.A. Smith, et al.Journal of Applied Physics
PaperElectron microscope studies of the structure and propagation of the Pd2Si/(111)Si interfaceD. Cherns, D.A. Smith, et al.Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
PaperFacetting of grain boundaries containing dislocationsD.A. Smith, P.M. HazzledineScripta Metallurgica
