William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
We have examined the dependence of a resistance on the cross-sectional area and on temperature of amorphous W-Re films. We find that the data qualitatively fits the expression for one dimensional quantum localization. © 1980.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Peter J. Price
Surface Science
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011